What Is the Difference Between Agilent ICP-MS and ICP-OES?

Identifying and quantifying elements from drug substances and products requires using the analytical methods ICP-OES and ICP-MS. In this article, the distinction between ICP-OES and ICP-MS is discussed.

Agilent ICP-MS

ICP-MS is used to analyze the isotopic composition of elements and trace elements in aqueous solutions in the concentration range of µg/L to ng/L. The Agilent ICP MS instrument enables the rapid identification of almost all metals and non-metals from acidified aqueous solutions with a total dissolved substance content of approximately 1 g/L.

Agilent ICP-OES

Optical emission spectroscopy with inductively coupled plasma routinely analyzes elements in aqueous solutions with concentrations between mg/L to µg/L. From acidified, aqueous solutions with a total dissolved substance content of approximately 1 g/L, the method allows the rapid identification of all metals and some non-metals.

Difference Between ICP-MS and ICP-OES

ICP-MS and ICP-OES have a lot of similarities and differences between them. Here are some of their differences in terms of:

• Principal
• Detection Range
• Cost of Procedure
• Expendable Supplies
• Preparation of Sample
• Instrument Performance

Cost of Procedure

ICP-OES is less expensive than ICP-MS, but its procedure costs are higher because it uses more argon gas. According to ICP-OES, photons do not have mass and no memory effects, making it a straightforward method that requires less preservation.

Generally, ICP-MS is more expensive because it requires a cleanroom and has handling costs. Due to its spare parts, it requires additional maintenance.

Preparation of Sample

Handling ICP-OES is typically simpler than ICP-MS. ICP-OES is exceptional in sample analysis speed, price, and convenience. It is more tolerant of the matrix and permits relatively large amounts of dissolved solids. Sample analysis can filter up to 60 elements in under a minute. In addition, sample requirements are typically between 0.1g and 1.0g.

ICP-MS operation is simple, but sample preparation is more important. It has the advantage of revealing elements present in much lower concentrations. Samples with high dissolved solids are unsuitable for analysis because the interface’s cones can become blocked. The ideal concentration is limited to 0.2 percent of dissolved solids, requiring sample dilution.

Instrument Performance

The basis for ICP-OES quantitation is the evaluation of ions and excited atoms at wavelengths appropriate for the particular elements measured.

However, ICP-MS uses mass spectrometry to determine the mass of an atom. A lower detection limit for ICP-MS may reach parts per trillion (ppt), whereas the lower bound for ICP-OES is parts per billion because of the distinction in metal element detection. ICP-MS is the instrument of choice if regulatory limits for the elements to be detected are under or close to the lower detection limit of ICP-OES.

Detection Range

ICP-OES is a multi-element method that is reasonably sensitive, has an evolving linear range, and a rational detection range appropriate for concentration levels from ppm to ppb.

Additionally, ICP-MS is an outstanding multi-element technique with exceptional responsiveness for trace analysis and high-precision isotope ratio studies. Ultra-trace detection range from ppb to ppt is possible with ICP-MS.

Principal

In ICP-OES, several elements’ electrons are excited in a plasma-like atmosphere, and light diffuses after the electrons are released. Elemental atoms are transformed into ions by an inductively coupled plasma source, separated and identified by a mass spectrometer.

ICP-MS measures the mass of the elemental ions created by the high-temperature argon plasma. Unknown materials can be detected and measured because ions created in the plasma are split based on their mass and load. The ions are then divided into groups by MS based on their mass/charge ratio. They are then sent to an electron multiplier tube that detects where each ion is identified and measured.

Expendable Supplies

The plasma torch and the test introduction area of the ICP-OES contain the most expendable supplies. On the other hand, the sampler and skimmer cones and the detector are placed inside the mass spectrometer as expendables.

Conclusion

The prerequisites for elemental impurity are much stricter than the previous heavy metal. Analysis requires a more susceptible, precise, and exact analytical method due to the complicated sample matrix and the strict limitations. It calls for testing methods and tools that are incredibly costly, delicate, and advanced.